Expertise

Dangerous Process Gas Handling and Safety Expertise

• News
• Test OK

III-V Materials Safety Protocols

Electron Microscopy – HRTEM, SEM

• In situ and real-time observation of nanocrystal growth in « NanoMAX », a modified ETEM
• Transmission Electron Microscopy-TEM

Photodetection

• Photodetection

Electrical device characterization

UV-VIS-and IR Multispectral Polarimetric Microscopy

UV-VIS-and IR Spectroscopic Ellipsometry

Sensor Characterization

Surface Characterization: SPM, TERS, Optical, Raman, XRD…

Batteries

• Fabrication of Lithium-Ion batteries

Large Area Plasma Processing

• Physical Vapour Deposition (PVD) Reactors

Advanced Optical Layer Deposition and Analysis

Synthesis of Organic Materials

Organic and Inorganic Semiconductor Thin Film Deposition

Optical properties of Diffractive Structures

• Metrology of nano-objects with Mueller polarimetry

Molecular Dynamics

• Molecular Dynamics Simulations

Thin film devices modeliing (finite élements and Spice approachs)

Fluid plasma models 1D and 2D

Monte-Carlo Simulations: optical, plasma…

Vacuum and Plasma System Design and Modelling